KLA Tencor 710-102570-02 Optical Interface Module
Product manual:
KLA Tencor 710-102570-02 Optical Interface Module
It is an optical component used in precision detection and measurement systems, widely used in the following fields:
Semiconductor Manufacturing Equipment
Applied to optical measurement systems (such as thin film thickness and critical dimension measurement), defect detection systems,
And in wafer process control equipment, achieve high-precision pattern detection and process control.
Wafer Inspection and Measurement System
Used for wafer defect detection, CD SEM (critical dimension scanning electron microscope) and other systems,
Support optical signal acquisition and multi wavelength analysis functions, enhance detection resolution and data interface capabilities.
Advanced packaging inspection
In new packaging processes such as 2.5D/3D packaging and Fan Out packaging,
Perform precision optical interface functions to ensure accurate transmission and processing of detection data.
OEM Optoelectronic System Integration
Used in customized automatic optical inspection (AOI), laser scanning systems, and high-end alignment equipment,
Provide stable optical communication and control support for devices.
Research and industrial testing applications
Used for high-resolution imaging in microelectronics, material analysis, and precision measurement laboratories
In microstructure detection and visual recognition systems.
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