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KLA Tencor 0020885-000 Analysis Board

Brand:KLA-Tencor
Model:0020885-000
Product status: New/used
Shipping place: Xiamen, China
Warranty: 365 days
Structural form: Other (specific form may vary depending on application)
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Details

KLA Tencor 0020885-000 Analysis Board

Product manual:

The KLA Tencor 0020885-000 analysis board is a core electronic module in semiconductor manufacturing testing equipment, specifically designed for high-precision signal processing and data analysis.
It mainly receives raw detection signals from various sensors (such as optical sensors, electron beam sensors, etc.)

Detailed application areas:

Real time data processing and analysis
Support high-speed data acquisition and parallel processing to achieve real-time analysis and feedback of detection data,
Satisfy the demand for fast detection and real-time adjustment in semiconductor production lines, greatly improving detection efficiency and response speed.

Multiple signal types supported
This analysis board is compatible with multiple sensor signals, including analog and digital signals,
It has functions such as signal filtering, amplification, conversion, and correction to improve data accuracy and overall system performance.

System Integration and Modular Design
As an important component of the detection system, the analysis board connects with other modules through standard interfaces

Stability and reliability
In the harsh environment of semiconductor production, analysis board design emphasizes high reliability and anti-interference ability,
Ensure stable performance of equipment during long-term, high load operation, reduce failure rates, and lower maintenance costs.

Support complex algorithm operations
Onboard high-speed processors and dedicated chips are capable of executing complex image processing algorithms and data analysis tasks,
Improve the resolution and accuracy of defect detection to assist in quality control of advanced process nodes.

Application scenarios
Suitable for various KLA Tencor wafer inspection equipment, including optical inspection systems
Particle counting systems, defect classification systems, etc. are widely used in multiple process stages of semiconductor wafer manufacturing.

Product details picture:


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