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KLA Tencor 710-650094-20 Controller

Brand:KLA-Tencor
Model:710-650094-20
Product status: New/used
Shipping place: Xiamen, China
Warranty: 365 days
Structural form: Other (specific form may vary depending on application)
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Details

KLA Tencor 710-650094-20 Controller

Product manual:

KLA Tencor 710-650094-20 Controller

product overview
The KLA Tencor 710-650094-20 controller is a high-performance industrial control module designed specifically for semiconductor wafer inspection and measurement equipment.

major function
Motion control
Control the start, stop, speed, and position of mechanical moving parts, supporting single axis or multi axis control,
Ensure the accuracy and stability of device positioning.

Signal Processing
Receive and process input signals from sensors and detection units,
Complete data conversion, filtering, and preprocessing to provide high-quality data for subsequent analysis.

Equipment coordination and communication
Through various industrial communication interfaces, achieve communication with the upper computer
High speed data exchange and instruction communication between other control modules and external devices.

system monitor
Real time monitoring of device status, detection of anomalies, support for fault alarms and safety protection,
Ensure the safe and reliable operation of the equipment.

Technical Characteristics
High integration design, integrating multiple I/O interfaces and communication ports to enhance system compatibility.

Supports multiple communication protocols such as Ethernet, RS-232, CAN, etc., facilitating device integration.

Embedded real-time operating system ensures timely response and execution of control tasks.

Wide working temperature range, suitable for harsh conditions in industrial environments.

Modular structure design, convenient for maintenance, upgrade, and replacement.

Typical application areas
Wafer inspection equipment
Control the mechanical motion and optical components of the detection platform to achieve high-precision defect detection.

Automatic Optical Inspection (AOI) System
Manage optical scanning, image acquisition and processing to improve detection efficiency and accuracy.

Semiconductor Manufacturing Equipment
Realize multi axis motion control and coordinated operation between equipment to enhance production automation level.

Precision Measuring Instruments
Control the measuring platform and sensors to achieve nanoscale positioning and data acquisition.

Product details picture:


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