KLA Tencor 710-651090-20 Optical Interface Module

Brand:KLA-Tencor
Model:710-651090-20
Product status: New/used
Shipping place: Xiamen, China
Warranty: 365 days
Structural form: Other (specific form may vary depending on application)
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Details

KLA Tencor 710-651090-20 Optical Interface Module

Product manual:

product overview
The KLA Tencor 710-651090-20 optical interface module is a critical electronic component designed specifically for semiconductor wafer inspection equipment,
Mainly used to connect and manage optical sensors and signal processing units in optical detection systems..

major function
Optical signal reception and conversion
Convert optical signals from optical sensors or scanning systems into electrical signals,
Facilitating subsequent digital processing and analysis.

High speed data transmission
Support high-speed optoelectronic signal data transmission to ensure real-time
High bandwidth detection data transmission improves detection efficiency.

Signal conditioning and filtering
Filter and amplify the received signal to reduce noise interference,
Improve signal quality and detection accuracy.

Strong interface compatibility
Supports multiple optical sensor interface standards and can flexibly integrate different types of optical components.

protection mechanism
Built in overvoltage and overcurrent protection functions ensure the safe and stable operation of modules and connected devices.

Technical Characteristics
High sensitivity optical signal receiving circuit, suitable for low light and high-speed scanning environments.

Broadband response to meet the processing requirements of optical signals with different wavelengths.

Low noise design ensures signal fidelity and improves the overall signal-to-noise ratio of the system.

Industrial grade design, suitable for high temperature, high humidity, and vibration environments.

Compact modular structure, convenient for internal integration and maintenance of equipment.

Typical application areas
Semiconductor wafer defect detection
Used for high-precision optical inspection systems, collecting and transmitting defect signals to achieve automated defect recognition.

Optical scanning system
Support data exchange between optical scanning probes and the main control unit to ensure real-time and accurate scanning process.

Imaging and measurement equipment
Cooperate with CCD or CMOS image sensors to ensure high-quality acquisition and transmission of optical signals.

Precision testing instruments
Used for connecting optical components to complete nanoscale measurements and analysis