KLA Tencor 710-657058-20 Drive

Brand:KLA-Tencor
Model:710-657058-20
Product status: New/used
Shipping place: Xiamen, China
Warranty: 365 days
Structural form: Other (specific form may vary depending on application)
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Details

KLA Tencor 710-657058-20 Drive

Product manual:

KLA Tencor 710-657058-20 Driver Product Application Fields Detailed Explanation
Core driver of autofocus system

This driver is used to control the LED light source inside the autofocus module,
Ensure the stability and accuracy of the light source output, thereby achieving clear focusing of images during wafer inspection.

Semiconductor wafer testing equipment

Applied to KLA Tencor wafer inspection equipment,
Support devices to achieve high-precision and high-speed surface defect detection, morphology measurement, and other functions.

The driver controls the light source to ensure that the optical system provides stable and uniform lighting conditions,
Thereby enhancing the sensitivity and reliability of the detection system.

Optical signal regulation and stability

By finely controlling the LED light source, it supports optical adjustment requirements in multiple detection modes,
Such as variations in light intensity, wavelength, etc.

Equipment maintenance and system upgrade support

Adopting modular design, it facilitates maintenance personnel to quickly replace drives and reduces equipment downtime.

The driver has strong compatibility and supports future functional expansion and technological upgrades of the system,
Improve the service life and investment return of equipment.

Industrial environment adaptability

Design to meet the strict requirements of semiconductor manufacturing cleanrooms and industrial environments,
Has good anti-interference ability and long-term stability.

Support continuous and high load operation to ensure stable production of the production line.

Improve production yield and testing efficiency

By precise control of autofocus and light source, the detection accuracy is significantly improved,
Help customers quickly identify defects and reduce the rate of defective products.

The KLA Tencor detection system can be widely applied to different models and configurations,
Including wafer surface defect detection, thickness measurement, contour scanning, etc.

An optical platform that supports multiple detection technologies,
It is an important component of achieving highly automated and intelligent detection.