KLA Tencor 710-658172-20 Wafer Inspection Board

Brand:KLA-Tencor
Model:710-658172-20
Product status: New/used
Shipping place: Xiamen, China
Warranty: 365 days
Structural form: Other (specific form may vary depending on application)
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Details

KLA Tencor 710-658172-20 Wafer Inspection Board

Product manual:

KLA Tencor 710-658172-20 Wafer Inspection Board
Product Overview:
This substrate is a core circuit connection component specifically designed for KLA Tencor wafer inspection equipment,
Usually installed in the main control system of equipment, it is used to coordinate and manage the electrical signals and power distribution of multiple functional modules.

major function
Centralized signal management:
Plays the role of a central bus, integrating image processing, motor control
Various signals such as sensor feedback are uniformly distributed and processed.

Power distribution and protection:
Allocate multiple voltages from the main power supply to each submodule,
And it has basic overcurrent and overvoltage protection functions to ensure the safe operation of the system.

Communication bridge between modules:
Realize interconnection between image acquisition cards, motion control cards, data storage units, etc,
Provide a hardware platform for efficient data flow and control instruction transmission.

Improve system reliability and maintainability:
Modular design allows for hot plugging and quick maintenance,
Support on-site replacement and expansion to reduce system downtime.

FEATURES
High stability PCB multi-layer design optimizes signal integrity and power isolation.

Industrial grade connectors ensure long-term reliable contact and vibration resistance.

Supports multi-channel high-speed communication and is compatible with mainstream KLA Tencor detection platforms (such as the 21xx series).

Strong environmental adaptability, suitable for continuous work in clean room environments.

Typical application scenarios
Wafer defect detection equipment: As a system bus, it coordinates the work of image acquisition and data analysis units.

Automatic Optical Inspection Equipment (AOI): Manage communication between high-speed image processing modules and drive control units.

Semiconductor wafer fab production line equipment: used for subsystem integration in critical equipment to enhance overall control performance and reliability.