KLA Tencor 720-24609-002 Sensor Module

Brand:KLA-Tencor
Model:720-24609-002
Product status: New/used
Shipping place: Xiamen, China
Warranty: 365 days
Structural form: Other (specific form may vary depending on application)
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Details

KLA Tencor 720-24609-002 Sensor Module

Product manual:

KLA Tencor 720-24609-002 Sensor Module
It is a key sensor interface unit used in KLA Tencor high-precision semiconductor detection equipment,
Mainly responsible for collecting and processing signals from various detection sensors, providing accurate raw data for subsequent control and image processing.

1、 Basic Product Information
Model: 720-24609-002

Type: Sensor Module

Series: KLA Tencor 720 Series

Functional positioning: Collecting, amplifying, filtering, and transmitting sensor signals as an important input unit for control systems

2、 Main functions
signal acquisition

Receive analog or digital signals output by various sensors (such as optical sensors, laser sensors, position encoders, etc.).

Perform preliminary processing on sensor signals, such as amplification, filtering, and denoising.

Signal Conversion

Convert analog signals into a format suitable for subsequent digital processing.

Provide standardized signal output to ensure compatibility with the control system.

data transmission

Stably transmit the processed signal to the main control board or data processing unit.

Support real-time data updates to meet high-speed detection requirements.

Status monitoring and protection

Monitor the status of sensors and signal links to prevent abnormal data from affecting the system.

Built in protection circuit to prevent overvoltage and overcurrent damage to modules and sensors.

3、 Application Fields
Wafer inspection and measurement equipment
As the core sensor interface, it ensures accurate data input for the detection head and scanning system.

Automated Control Platform
Collect mechanical position signals, environmental parameters, etc. to assist in equipment motion control and process adjustment.

Image acquisition system
Cooperate with optical sensors to achieve high-precision detection of surface defects and morphology on wafers.